TFM systems are practical reflectance-based thickness measurement platforms for manual inspection, automated mapping, contact measurement, and remote integration.
Choose the TFM package that matches your measurement workflow.
A compact reflectance-based TFM system for thickness measurement on wafer, glass, polymer, and coating samples.
A motorized TFM system for automated multi-point thickness mapping on wafer, glass, panel, and process samples.
A contact-style TFM package for large, curved, or installed coated parts where the probe moves to the part.
TFM measurement system for external control, remote operation, and integration workflows.
Lite supports recipe setup, measurement, thickness analysis, and result review for TFM systems.
Find representative thin-film and coating applications by sample type.